March 27–28, 2009
Tomsk, Russia
Ñall for Papers in PDF
Organized by
The Tomsk Chapter & Student Branch of the Institute of Electrical and Electronics Engineers, IEEE;
GOLD (Graduates of the Last Decade) Affinity Group of the IEEE Russia Siberia Section;
Radar R&D of the Tomsk State University of Control Systems and Radioelectronics;
Tomsk Polytechnic University;
IEEE Russia Siberia Section.
Sponsors
Russian Foundation for Basic Researches (RFBR);
Radar R&D.
Technical Sponsors
The IEEE Communications Society (ComSoc);
The Electron Devices Society (IEEE ED-S);
The Microwave Theory and Techniques Society of the IEEE (MTT-S);
Tomsk IEEE Chapter & Student Branch.
Assistance and Participation
Siberian Physics-Technical Institute of the Tomsk State University.
INVITATION
The eighth Siberian conference SIBCON-2009 aims to offer opportunities to learn and to share information on the latest advances in communications and control systems. It will be held in Tomsk, the Russian Federation, on March 27–28, 2009. The conference is organized by the IEEE on a regular basis in order to promote interdisciplinary discussion and interaction among scientists and engineers with an emphasis on the IEEE membership.
TOPICS
The areas of interest include, but are not limited to:
1. The Fundamental Problems of
Communication and Control Theory.
2. Subsurface Radar and Remote
Sensing.
3. Semiconductor Materials, Sensors, and Electron Devices.
The conference will include plenary sessions (with invited speakers), parallel thematic sessions (with oral presentations), and a social program.
ABSTRACT SUBMISSION
Prospective authors are invited to submit papers of their original research contributions describing new results, original ideas, and applications on relevant topics. The abstracts should be sent in English, by e mail, in MS Word file, maximum length of seven À5 (14.8õ21 cm) pages (with margins at 2.5 cm, 10-point Times New Roman or similar fonts, and single spaced). The manuscripts should contain the following information: paper title, keywords, state-of-the-art in the field of interest, problem statement and objective, description of the contribution (novelty, research methodology), results achieved and their further development and applicability, references, author(s) data (name, title, affiliation, full mailing address, phone and fax numbers, e-mail address), and corresponding author name.
PUBLICATION
The International Program Committee will make the selection of papers. Papers will be reviewed for the technical merit and content. Only original, unpublished contributions will be considered.
The conference proceedings will be published in English, containing all conference manuscripts, and will be distributed among the conference participants, leading libraries, and international scientific centers. The Proceedings are indexed in IEEE Xplore.
Notifications of paper acceptance and the preliminary program will be sent to the first author in January 2008.
Deadline for paper submission is
December 10, 2008
REGISTRATION FEE
The registration fee – $180 for IEEE members and $280 for other participants needs be paid only upon receipt of the official invitation letter, which will be sent to the first author by mail. Registration fee includes a visa support, one copy of the Proceedings, a get-together party, banquet, cultural/technical visits, and coffee breaks.
VISAS
You may be required to apply for entry Russian visa in advance. Visa application can take up to three-four month to be processed. Please contact the conference organizers in time to get an official invitation.
COURSES
The Organizing Committee accepts proposals for short courses related to the conference topics until December 10, 2008.
CONFERENCE LANGUAGE
The working language is English. No simultaneous translation will be provided. All materials concerning the conference should be written in English.
CONFERENCE CHAIRMAN
Dr. O.V. STUKACH, Tomsk IEEE Chapter
INTERNATIONAL PROGRAM COMMITTEE
Dr. S.P. Lukyanov, Russia
Prof. A. Dziech, Poland
Prof. A.D. Gelman, USA
Prof. I.J. Immoreev, Russia
Dr. T. Orzechowski, Poland
Prof. A.N. Fionov, Russia
Prof. B.Yu. Kapilevich, Israel
Prof. J.D. Taylor, USA
Dr. O.A. Kozhemyak, Russia
Dr. M.A. Pozhenko, South Korea
Dr. N.A. Dvurechenskaya, Russia
Dr. A.K. Baranovski, Belarus
Dr. D.A. Tkachenko, Russia
Dr. K.M. Stallo, Italy
Prof. S.L. Fletcher, Canada
Prof. O.P. Tolbanov, Russia
Prof. A.R. Wend, France
Dr. L.A. Fokin, Russia
Prof. R.M. Barnet, Germany
Prof. A.A. Shelupanov, Russia
Prof. R.V. Gupta, India
Dr. A.V. Tyazhev, Russia
VENUE
TOMSK, one of the oldest Siberian towns, was founded in 1604 on the high upper bank of the Tom River. It is a historical city of 400 years old, with a present population of 520,000. Houses decorated with wooden lace, gold-plated church domes – the beauty of the streets earns for Tomsk its reputation as a historical center of Siberia. However, despite its venerable age, Tomsk appears youthful thanks to the students and young scientists. Nowadays, there are ten academic institutes and six universities in Tomsk. The oldest, Tomsk State University, has brought the glory of “Siberian Athens” to the city. Modern Tomsk is a large, generally acknowledged Russian educational and research center. Tomsk-based experts have made a valuable contribution in the advancement of radioelectronics, precision mechanical engineering and metal working, up-to-date building industries, and automatization production.
As one of the oldest cities in Siberia, Tomsk offers many architectural monuments to the past, as well as distinctive wooden houses decorated by wood-carving (see at the Web http://www.arttomsk.net/woodentomsk/. There exist numerous historical, cultural and architectural landmarks drawing visitor’s attention. Like a magnet it attracts the best people of each epoch. More about Tomsk may be learned at Web site http://www.tomsk.ru.
DETAILED INFORMATION
All detailed information concerning registration and hotel reservation forms, instructions for the preparation full camera-ready paper text etc. will be available in second announcement and at the Web http://www.comsoc.org/tomsk.
CORRESPONDENCE
Dr. Oleg V. Stukach
Department of Computer-Aided Measurement
Systems and Metrology
Tomsk Polytechnic University
30 Lenin Avenue, Tomsk,
634050, Russia
Phone: +7–3822–421141
E-mail: tomsk@ieee.org