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IEEE Wireless Communications Editorial Board

EDITOR-IN-CHIEF

IEEE Wireless Editor

Hamid Gharavi
National Institute of Standards and Technology (NIST)

 

ASSOCIATE EDITOR-IN-CHIEF

Yi Qian
University of Nebraska - Lincoln, USA

 

DIRECTOR OF MAGAZINES

Raouf Boutaba
David R. Sheraton School of Computer Science
University of Waterloo
200 University Avenue West
Waterloo, Ontario, N2L 3G1, Canada
Tel: +1 (519) 888-4820
E-mail: rboutaba@uwaterloo.ca
Website: http://rboutaba.cs.uwaterloo.ca/

 

DEPARTMENT EDITORS

BOOK REVIEWS

Satyajayant Misra
New Mexico State University

 

INDUSTRIAL PERSPECTIVES

Chun-Yen Wang
Industrial Technology Research Institute (ITRI), Taiwan

 

SCANNING THE LITERATURE

Pan Li
Case Western Reserve University, USA

 

SPECTRUM POLICY AND REGULATORY ISSUES

Michael Marcus
Marcus Spectrum Solutions, USA

 

IEEE VEHICULAR TECHNOLOGY LIAISON

Theodore Rappaport
The University of Texas at Austin, USA

 

IEEE COMPUTER SOCIETY LIAISON

Mike Liu
Ohio State University, USA

 

TECHNICAL EDITORS

Abderrahim Benslimane, University of Avignon, France

Gilberto Berardinelli, Aalborg University, Denmark

Han-Chieh Chao, National I-Lan University, Taiwan

Periklis Chatzimisios, Alexander TEI of Thessaloniki, Greece

Xiuzheng Cheng, George Washington University, USA

Xiaojiang Du, Temple University, USA

Chuan Heng Foh, The University of Surrey, UK

Xiaohu Ge, Huazhong University of Science and Technology, China

Mohsen Guizani, University of Idaho, USA

Ekram Hossain, University of Manitoba, Canada

Rose Qingyang Hu, Utah State University, USA

Minho Jo, Korea University, Korea

Nei Kato, Tohoku University, Japan

SuKyoung Lee, Yonsei University, Korea

Phone Lin, National Taiwan University, Taiwan

Ying-Dar Lin, National Chiao-Yung University, Taiwan

Stanley Kuang-Hao Liu, National Cheng Kung University, Taiwan

Javier Lopez, University of Malaga, Spain

Aarne Mämmelä, VTT Technical Research Centre of Finland

Weixiao Meng, Harbin Institute of Technology, China

Mohammad S. Obaidat, Fordham University, USA

Kui Ren, Illinois Institute of Technology, USA

Joel Rodrigues, University of Beira Interior, Portugal

Kamran Sayrafian, NIST, USA

John Shea, University of Florida, USA

Athanasios V. Vasilakos, Luleå University of Technology, Sweden

Alexey Vinel, Halmstad University, Sweden

Yonggang Wen, Nanyang Technological University, Singapore

Christian Wietfeld, TU Dortmund University of Technology, Germany

Sherali Zeadally, University of Kentucky, USA

Yanchao Zhang, Arizona State University, USA